The 14th International Conference on Beam Injection Assessment of Microstructures in Semiconductors

2018년 6월 18일-6월 21일, 서울 코리아나 호텔에서 열린 The 14th International Conference on Beam Injection Assessment of Microstructures in Semiconductors (BIAMS 2018)에 이건엽, 김수현, 최용하 학생이 참석하였습니다.

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"Characterization Defects in Graphene for sensor Application" -poster presentation

"Observation of Thickness Change in Black Phosphorous Through Raman Spectroscopy" -oral presentation

"Multilayer Graphene Produced by Transfer-Free Direct Growth Method and Its Identification Using Raman Spectroscopy" -oral presentation

박사과정 김수현 학생이 BIAMS 2018학회 Best Oral Presentation Award을 수상하였습니다.

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